A universal reliability prediction model for SMD integrated circuits based on field failures
Titel:
A universal reliability prediction model for SMD integrated circuits based on field failures
Auteur:
Kervarrec, G. Monfort, M.L. Riaudel, A. Klimonda, P.Y. Coudrin, J.R. Le Razavet, D. Boulaire, J.Y. Jeanpierre, P. Perie, D. Meister, R. Casassa, S. Haumont, J.L. Liagre, B.