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Journal description
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Details for article 15 of 127 found articles
| Title: |
Assessment of worst case dielectric failure rate based on statistical samples with pure intrinsic failure distributions |
| Author: |
Kerber, Martin |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 6-7 pages 4 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 127 found articles
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