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Details for article 263 of 3051 found articles
| Title: |
An example of fault site localization on a 0.18 μm CMOS device with combination of front and backside techniques |
| Author: |
Yamada, Yoshiteru Komoda, Hirotaka |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 44 (2004) nr. 5 pages 8 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 263 of 3051 found articles
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