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Journal description
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Details for article 100 of 3051 found articles
| Title: |
A high-quality cross-sectional transmission electron microscope specimen preparation technique for structural and interfacial property studies in microelectronic packaging |
| Author: |
Marks, M.R. Wei, Qin Jiaji, Wang Yi, Chen |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 35 (1995) nr. 5 pages 9 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 100 of 3051 found articles
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