|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 947 of 4365 found articles
| Title: |
Comprehensive test patterns with modular test structures: The 2 by N probe-pad array approach |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 20 (1980) nr. 4 pages 1 p. |
| Year: |
1980 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 947 of 4365 found articles
| << previous | next >> |