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Journal description
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Details for article 21 of 190 found articles
| Title: |
Carrier trapping in thin N2O-grown oxynitride/oxide di-layer for PowerMOSFET devices |
| Author: |
Currò, Giuseppe Camalleri, Marco Calì, Denise Monforte, Francesca Neri, Fortunato |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 4-5 pages 4 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 190 found articles
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