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Journal description
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Details for article 184 of 190 found articles
| Title: |
Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response |
| Author: |
Pershenkov, V.S. Avdeev, S.V. Tsimbalov, A.S. Levin, M.N. Belyakov, V.V. Ivashin, D.V. Slesarev, A.Y. Bashin, A.Y. Zebrev, G.I. Ulimov, V.N. Emelianov, V.V. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 4-5 pages 8 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 184 of 190 found articles
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