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Details for article 273 of 3981 found articles
| Title: |
An analytic method to compute the stress dependence on the dimensions and its influence in the characteristics of triple gate devices |
| Author: |
Trevisoli, Renan Doria Martino, João Antonio Simoen, Eddy Claeys, Cor Pavanello, Marcelo Antonio |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 52 (2012) nr. 3 pages 6 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 273 of 3981 found articles
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