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Journal description
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Details for article 241 of 3981 found articles
| Title: |
Analysis of dependence of short-channel effects in double-gate MOSFETs on channel thickness |
| Author: |
Kobayashi, Yusuke Kakushima, Kuniyuki Ahmet, Parhat Ramgopal Rao, V. Tsutsui, Kazuo Iwai, Hiroshi |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 3 pages 6 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 241 of 3981 found articles
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