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Journal description
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Details for article 290 of 2875 found articles
| Title: |
A practical metric for soft error vulnerability analysis of combinational circuits |
| Author: |
Raji, Mohsen Pedram, Hossein Ghavami, Behnam |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 2 pages 13 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 290 of 2875 found articles
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