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Journal description
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Details for article 259 of 2875 found articles
| Title: |
A physical based model to predict performance degradation of FinFET accounting for interface state distribution effect due to hot carrier injection |
| Author: |
Ma, Chenyue Zhang, Lining Zhang, Chenfei Zhang, Xiufang He, Jin Zhang, Xing |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 51 (2011) nr. 2 pages 5 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 259 of 2875 found articles
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