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Journal description
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Details for article 5 of 31 found articles
| Title: |
Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges |
| Author: |
Chen, F. Graas, Carole Shinosky, Michael Zhao, Kai Narasimha, Shreesh Liu, Xiao Hu Tian, Chunyan |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 12PB pages 21 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 31 found articles
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