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Journal description
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Details for article 535 of 827 found articles
| Title: |
Observation and mechanism explanation of the parasitic charge pumping current |
| Author: |
Dai, Mingzhi Yap, Kinleong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 12 pages 5 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 535 of 827 found articles
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