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Details for article 481 of 827 found articles
| Title: |
Methodology for accurate extrapolation of InGaP/GaAs HBT safe operating area (SOA) for variations in emitter area and ballast resistor size |
| Author: |
Howell, Robert S. Lewis, Randall Henry, H. George Hearne, Harold Brown, Deas Dawson, Dale Ezis, Andris |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 12 pages 6 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 481 of 827 found articles
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