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Journal description
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Details for article 235 of 827 found articles
| Title: |
Detailed investigation of the effects of La and Al content on the electrical characteristics and reliability properties of La–Al–O gate dielectrics |
| Author: |
Suzuki, Masamichi Koyama, Masato Kinoshita, Atsuhiro |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 12 pages 4 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 235 of 827 found articles
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