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Journal description
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Details for article 149 of 276 found articles
| Title: |
Long-term NBTI degradation under real-use conditions in IBM microprocessors |
| Author: |
Lu, Pong-Fei Jenkins, Keith A. Webel, Tobias Marquardt, Oliver Schubert, Birgit |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 11 pages 7 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 149 of 276 found articles
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