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Journal description
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Details for article 89 of 123 found articles
| Title: |
Reliability and degradation behaviors of semi-insulating Fe-doped InP buried heterostructure lasers fabricated by movpe and dry etching technique |
| Author: |
Mawatari, Hiroyasu Fukuda, Mitsuo Matsumoto, Shin-Ichi Kishi, Kenji Itaya, Yoshio |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 36 (1996) nr. 11-12 pages 1915-1918 |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 89 of 123 found articles
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