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Journal description
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Details for article 560 of 3138 found articles
| Title: |
Characterization of solder interfaces using laser flash metrology |
| Author: |
Chiu, Chia-Pin Maveety, James G Tran, Quan A |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 1 pages 8 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 560 of 3138 found articles
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