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                                       Details for article 429 of 3138 found articles
 
 
  Availability and MTTF analysis of a three state repairable redundant electronic equipment under critical human errors
 
 
Title: Availability and MTTF analysis of a three state repairable redundant electronic equipment under critical human errors
Author: Gupta, P.P.
Sharma, Rakesh Kumar
Appeared in: Microelectronics reliability
Paging: Volume 26 (1986) nr. 1 pages 6 p.
Year: 1986
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 429 of 3138 found articles
 
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