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Journal description
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Details for article 263 of 3138 found articles
| Title: |
A physical approach on SCOBIC investigation in VLSI |
| Author: |
Beauchêne, T. Lewis, D. Beaudoin, F. Pouget, V. Perdu, P. Fouillat, P. Danto, Y. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 43 (2003) nr. 1 pages 5 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 263 of 3138 found articles
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