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Journal description
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Details for article 189 of 253 found articles
| Title: |
Reliability analysis of two-unit warm standby system with partial failure mode and inspection time |
| Author: |
Pandey, D.K. Gupta, S.M. Jaiswal, N.K. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 32 (1992) nr. 1-2 pages 3 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 189 of 253 found articles
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