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Journal description
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Details for article 29 of 71 found articles
| Title: |
Evaluation of electrolessly deposited NiP integral resistors on flexible polyimide substrate |
| Author: |
Waris, Tuomas F. Turunen, Markus P.K. Laurila, Tomi Kivilahti, Jorma K. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 45 (2005) nr. 3-4 pages 9 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 29 of 71 found articles
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