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Characterisation of degradation mechanisms in resonant tunnelling diodes |
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Title: |
Characterisation of degradation mechanisms in resonant tunnelling diodes |
Author: |
Vogt, A. Brandt, M. Sigurdardottir, A. Schüssler, M. Peña, D. Simon, A. Hartnagel, H.L. Rodewald, M. Roesner, M. Fuess, H. Goswami, S.N.N. Lal, K. |
Appeared in: |
Microelectronics reliability |
Paging: |
Volume 37 (1997) nr. 10-11 pages 4 p. |
Year: |
1997 |
Contents: |
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Publisher: |
Published by Elsevier B.V. |
Source file: |
Elektronische Wetenschappelijke Tijdschriften |
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