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Journal description
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Details for article 6 of 34 found articles
| Title: |
Comparative studies on electrical bias temperature instabilities of In–Ga–Zn–O thin film transistors with different device configurations |
| Author: |
Ryu, Min-Ki Ko Park, Sang-Hee Hwang, Chi-Sun Yoon, Sung-Min |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 89 (2013) nr. C pages 6 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 34 found articles
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