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                                       Details for article 2 of 34 found articles
 
 
  Analysis and optimisation of ohmic contact resistance and surface morphology of a Ta-based diffusion barrier layer in AlGaN/GaN HEMTs on Si (111) substrates
 
 
Title: Analysis and optimisation of ohmic contact resistance and surface morphology of a Ta-based diffusion barrier layer in AlGaN/GaN HEMTs on Si (111) substrates
Author: Cho, Sung-Jin
Wang, Cong
Kim, Nam-Young
Appeared in: Solid-state electronics
Paging: Volume 89 (2013) nr. C pages 8 p.
Year: 2013
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 34 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands