Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology
Titel:
Impact of local back biasing on performance in hybrid FDSOI/bulk high-k/metal gate low power (LP) technology
Auteur:
Fenouillet-Beranger, C. Perreau, P. Benoist, T. Richier, C. Haendler, S. Pradelle, J. Bustos, J. Brun, P. Tosti, L. Weber, O. Andrieu, F. Orlando, B. Pellissier-Tanon, D. Abbate, F. Richard, C. Beneyton, R. Gregoire, M. Ducote, J. Gouraud, P. Margain, A. Borowiak, C. Bianchini, R. Planes, N. Gourvest, E. Bourdelle, K.K. Nguyen, B.Y. Poiroux, T. Skotnicki, T. Faynot, O. Boeuf, F.