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Journal description
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Details for article 14 of 16 found articles
| Title: |
Temperature and gate bias dependence of carrier transport mechanisms in amorphous indium–gallium–zinc oxide thin film transistors |
| Author: |
Huang, Xiaoming Wu, Chenfei Lu, Hai Ren, Fangfang Chen, Dunjun Jiang, Rong Zhang, Rong Zheng, Youdou Xu, Qingyu |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 86 (2013) nr. C pages 4 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 16 found articles
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