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Journal description
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Details for article 26 of 31 found articles
| Title: |
Sensitivity-based investigation of threshold voltage variability in 32-nm flash memory cells and MOSFETs |
| Author: |
Bonfiglio, Valentina Iannaccone, Giuseppe |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 84 (2013) nr. C pages 5 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 26 of 31 found articles
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