|
Characterization of DC, analog/RF, and low frequency noise in silicon-on-insulator nMOSFETs with different body-contact structures |
|
|
|
Titel: |
Characterization of DC, analog/RF, and low frequency noise in silicon-on-insulator nMOSFETs with different body-contact structures |
Auteur: |
Yang, Rong Qian, He Li, Junfeng Xiong, Yong-Zhong Shi, Jinling Loh, Wei-Yip Yu, Mingbin Lo, Patrick Guo-Qiang Balasubramanian, N. Kwong, D.-L. |
Verschenen in: |
Solid-state electronics |
Paginering: |
Jaargang 80 (2013) nr. C pagina's 4 p. |
Jaar: |
2013 |
Inhoud: |
|
Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
|
|
|
|