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                                       Details for article 9 of 24 found articles
 
 
  Enhancement of FinFET performance using 25-nm-thin sidewall spacer grown by atomic layer deposition
 
 
Title: Enhancement of FinFET performance using 25-nm-thin sidewall spacer grown by atomic layer deposition
Author: Endo, Kazuhiko
Ishikawa, Yuki
Matsukawa, Takashi
Liu, Yongxum
O’uchi, Shin-ichi
Sakamoto, Kunihiro
Tsukada, Junichi
Yamauchi, Hiromi
Masahara, Meishoku
Appeared in: Solid-state electronics
Paging: Volume 74 (2012) nr. C pages 6 p.
Year: 2012
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 9 of 24 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands