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Journal description
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Details for article 7 of 19 found articles
| Title: |
Distribution of deep-level traps at atomic-layer-deposited Al2O3/n-GaN interface |
| Author: |
Yan, Dawei Lu, Hai Chen, Dunjun Zhang, Rong Zheng, Youdou Qian, Xu Li, Aidong |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 72 (2012) nr. C pages 4 p. |
| Year: |
2012 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 19 found articles
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