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                                       Details for article 11 of 19 found articles
 
 
  Influence of processing and annealing steps on electrical properties of InAlN/GaN high electron mobility transistor with Al2O3 gate insulation and passivation
 
 
Title: Influence of processing and annealing steps on electrical properties of InAlN/GaN high electron mobility transistor with Al2O3 gate insulation and passivation
Author: Čičo, K.
Gregušová, D.
Kuzmík, J.
Jurkovič, M.
Alexewicz, A.
di Forte Poisson, M.-A.
Pogany, D.
Strasser, G.
Delage, S.
Fröhlich, K.
Appeared in: Solid-state electronics
Paging: Volume 67 (2012) nr. 1 pages 5 p.
Year: 2012
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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