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Journal description
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Details for article 6 of 16 found articles
| Title: |
Detailed study about influence of oxygen on trap properties in SiO x N y by the thermally stimulated current and maximum entropy method |
| Author: |
Yonamoto, Yoshiki Inaba, Yutaka Akamatsu, Naotoshi |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 64 (2011) nr. 1 pages 3 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 16 found articles
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