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Journal description
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Details for article 3 of 12 found articles
| Title: |
Detailed investigation of effective field, hole mobility and scattering mechanisms in GeOI and Ge pMOSFETs |
| Author: |
Van Den Daele, W. Le Royer, C. Augendre, E. Mitard, J. Ghibaudo, G. Cristoloveanu, S. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 59 (2011) nr. 1 pages 9 p. |
| Year: |
2011 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 12 found articles
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