Investigation of charge-trap memories with AlN based band engineered storage layers
Titel:
Investigation of charge-trap memories with AlN based band engineered storage layers
Auteur:
Molas, G. Colonna, J.P. Kies, R. Belhachemi, D. Bocquet, M. Gély, M. Vidal, V. Brianceau, P. Martinez, E. Papon, A.M. Licitra, C. Vandroux, L. Ghibaudo, G. De Salvo, B.