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Journal description
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Details for article 43 of 43 found articles
| Title: |
Variable temperature characterization of low-dimensional effects in tri-gate SOI MOSFETs |
| Author: |
Barrett, C. Lederer, D. Redmond, G. Xiong, W. Colinge, J.P. Quinn, A.J. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 54 (2010) nr. 11 pages 5 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 43 of 43 found articles
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