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                                       Details for article 8 of 32 found articles
 
 
  Charge trapping and current-conduction mechanisms of metal–oxide–semiconductor capacitors with La x Ta y dual-doped HfON dielectrics
 
 
Title: Charge trapping and current-conduction mechanisms of metal–oxide–semiconductor capacitors with La x Ta y dual-doped HfON dielectrics
Author: Cheng, Chin-Lung
Horng, Jeng-Haur
Chang-Liao, Kuei-Shu
Jeng, Jin-Tsong
Tsai, Hung-Yang
Appeared in: Solid-state electronics
Paging: Volume 54 (2010) nr. 10 pages 7 p.
Year: 2010
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 8 of 32 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands