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                                       Details for article 3 of 16 found articles
 
 
  Analysis of noise in CMOS image sensor based on a unified time-dependent approach
 
 
Title: Analysis of noise in CMOS image sensor based on a unified time-dependent approach
Author: Brouk, Igor
Nemirovsky, Amikam
Alameh, Kamal
Nemirovsky, Yael
Appeared in: Solid-state electronics
Paging: Volume 54 (2010) nr. 1 pages 9 p.
Year: 2010
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 16 found articles
 
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