Proton-induced SEU in SiGe digital logic at cryogenic temperatures
Titel:
Proton-induced SEU in SiGe digital logic at cryogenic temperatures
Auteur:
Sutton, Akil. K. Moen, Kurt Cressler, John D. Carts, Martin A. Marshall, Paul W. Pellish, Jonathan A. Ramachandran, Vishwa Reed, Robert A. Alles, Michael L. Niu, Guofu