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                                       Details for article 24 of 37 found articles
 
 
  Impacts of a buffer layer and hydrogen-annealed wafers on the performance of strained-channel nMOSFETs with SiN-capping layer
 
 
Title: Impacts of a buffer layer and hydrogen-annealed wafers on the performance of strained-channel nMOSFETs with SiN-capping layer
Author: Tsai, Tzu-I
Lin, Horng-Chih
Lee, Yao-Jen
Chen, King-Sheng
Wang, Jeff
Hsueh, Fu-Kuo
Chao, Tien-Sheng
Huang, Tiao-Yuan
Appeared in: Solid-state electronics
Paging: Volume 52 (2008) nr. 10 pages 7 p.
Year: 2008
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 24 of 37 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands