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Journal description
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Details for article 21 of 28 found articles
| Title: |
Modelling and measurements of the parasitic electrostatic capacitances in Si/SiGe n-HFET |
| Author: |
Zerounian, N. Enciso-Aguilar, M. Hackbarth, T. Herzog, H.-J. Aniel, F. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 51 (2007) nr. 3 pages 11 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 28 found articles
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