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Journal description
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Details for article 2 of 43 found articles
| Title: |
Analysis and understanding of unique cryogenic phenomena in state-of-the-art SiGe HBTs |
| Author: |
Liang, Qingqing Krithivasan, Ramkumar Ahmed, Adnan Lu, Yuan Li, Ying Cressler, John D. Niu, Guofu Rieh, Jae-Sung Freeman, Greg Ahlgren, Dave Joseph, Alvin |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 50 (2006) nr. 6 pages 9 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 43 found articles
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