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Journal description
All volumes of the corresponding journal
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Details for article 12 of 36 found articles
| Title: |
Characterization of silicon–germanium heterojunction bipolar transistors degradation in silicon–germanium BiCMOS technologies |
| Author: |
Lee, Seung-Yun Park, Chan Woo |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 50 (2006) nr. 3 pages 7 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 36 found articles
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