|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 2 of 29 found articles
| Title: |
Analysis of variation in leakage currents of Lanthana thin films |
| Author: |
Kim, Yongshik Ohmi, Shun-ichiro Tsutsui, Kazuo Iwai, Hiroshi |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 49 (2005) nr. 5 pages 9 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 29 found articles
| << previous | next >> |