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Journal description
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Details for article 7 of 22 found articles
| Title: |
Dynamic threshold voltage MOS in partially depleted SOI technology: a wide frequency band analysis |
| Author: |
Dehan, Morin Raskin, Jean-Pierre |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 49 (2005) nr. 1 pages 6 p. |
| Year: |
2005 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 22 found articles
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