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                                       Details for article 6 of 34 found articles
 
 
  Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
 
 
Title: Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
Author: Rosmeulen, Maarten
Breuil, Laurent
Lorenzini, Martino
Haspeslagh, Luc
Houdt, Jan Van
Meyer, Kristin De
Appeared in: Solid-state electronics
Paging: Volume 48 (2004) nr. 9 pages 6 p.
Year: 2004
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 34 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands