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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 6 of 17 found articles
| Title: |
DC and AC MOS transistor modelling in presence of high gate leakage and experimental validation |
| Author: |
Gilibert, F. Rideau, D. Bernardini, S. Scheer, P. Minondo, M. Roy, D. Gouget, G. Juge, A. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 48 (2004) nr. 4 pages 12 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 17 found articles
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