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Details for article 2 of 74 found articles
| Title: |
A comparison of the AlN annealing cap for 4H–SiC annealed in nitrogen versus argon atmosphere |
| Author: |
Derenge, M.A. Jones, K.A. Kirchner, K.W. Ervin, M.H. Zheleva, T.S. Hullavarad, S. Vispute, R.D. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 48 (2004) nr. 10-11 pages 6 p. |
| Year: |
2004 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 74 found articles
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