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                                       Details for article 27 of 30 found articles
 
 
  Rapid post-metallization annealing effects on high-k Y2O3/Si capacitor
 
 
Title: Rapid post-metallization annealing effects on high-k Y2O3/Si capacitor
Author: Lay, T.S.
Liao, Y.Y.
Liu, W.D.
Lai, Y.H.
Hung, W.H.
Kwo, J.
Hong, M.
Mannaerts, J.P.
Appeared in: Solid-state electronics
Paging: Volume 47 (2003) nr. 6 pages 5 p.
Year: 2003
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 27 of 30 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands