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Journal description
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Details for article 8 of 40 found articles
| Title: |
A review of leakage current in SOI CMOS ICs: impact on parametric testing techniques |
| Author: |
Iñı́guez, Benjamı́n Raskin, Jean-Pierre Simon, Pascal Flandre, Denis Segura, Jaume |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 47 (2003) nr. 11 pages 9 p. |
| Year: |
2003 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 40 found articles
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